Recent Developments in Scanning Tunneling Microscopy

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Recent Developments in Scanning Tunneling Spectroscopy of Semiconductor Surfaces

Several recent developments in scanning tunneling spectroscopy (STS) of semiconductor surfaces are reviewed. First, the normalization of spectra is discussed, which for the Si(111)2×1 surface is found to produce a small shift in the apparent position of band edges. With this correction, the surface band gap measured by STS is found to be in good agreement with that obtained by other experimenta...

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Recent advances in atomic-scale spin-polarized scanning tunneling microscopy.

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ژورنال

عنوان ژورنال: Acta Physica Polonica A

سال: 1993

ISSN: 0587-4246,1898-794X

DOI: 10.12693/aphyspola.84.419